Toshikazu Nishida

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Found 154 results
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Filters: Author is Toshikazu Nishida
2019
Shekhawat, A., G. Walters, C. Chang Chung, Y. Liu, R. Garcia, J. Jones, T. Nishida, and S. Moghaddam, Effect of furnace annealing on the ferroelectricity of Hf0.5 Zr0.5O2 thin films, 2019.
Smith, C. S., K. Sondhi, H. Z. Fan, T. Nishida, and D. P. Arnold, "Effect of Mechanical Cycling on the Magnetic Properties of Permalloy Films Electroplated on Stretchable Substrates", 2019 IEEE International Flexible Electronics Technology Conference (IFETC)2019 IEEE International Flexible Electronics Technology Conference (IFETC), Vancouver, BC, Canada, IEEE, 2019.
2017
Lomenzo, P. D., C-C. Chung, C. Zhou, J. L. Jones, and T. Nishida, "Doped Hf0.5Zr 0.5O 2 for high efficiency integrated supercapacitors", Applied Physics Letters, vol. 110, issue 23, pp. 232904, jun-09-2017.
Ghatge, M., G. Walters, T. Nishida, and R. Tabrizian, "Phononic detection of morphological phase transition in atomic-layered Hafnium-Zirconium-Oxide", 2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), Kaohsiung, Taiwan, IEEE, 2017.
2012
Prasad, A., Q-S. Xue, V. Sankar, T. Nishida, G. Shaw, W. J. Streit, and J. C. Sanchez, "Comprehensive characterization and failure modes of tungsten microwire arrays in chronic neural implants", Journal of Neural Engineering, vol. 9, issue 5, no. 5, pp. 056015, 09/2012.
Prasad, A., Q-S. Xue, V. Sankar, T. Nishida, G. Shaw, W. J. Streit, and J. C. Sanchez, "Comprehensive characterization of tungsten microwires in chronic neurocortical implants", 34th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, Aug 28-Sep 1, 2012.
Prasad, A., Q-S. Xue, V. Sankar, T. Nishida, G. Shaw, W. J. Streit, and J. C. Sanchez, "Predicting Microelectrode Array Functionality Using Biotic and Abiotic Metrics in Vivo", 34th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, Aug 28-Sep 1, 2012.
Dieme, R., J. Zhang, N. G. Rudawski, K. Jones, G. Bosman, M. Sheplak, and T. Nishida, "Process Dependence of 1/f Noise and Defects in Ion Implanted p-Type Piezoresistors", Journal of Applied Physics, vol. 112, 2012.