Structure of 3 at.% and 9 at.% Si-doped HfO 2 from combined refinement of X-ray and neutron diffraction patterns

TitleStructure of 3 at.% and 9 at.% Si-doped HfO 2 from combined refinement of X-ray and neutron diffraction patterns
Publication TypeJournal Article
Year of Publication2015
AuthorsZhao, L., D. Hou, T-M. Usher, T. Iamsasri, C. M. Fancher, J. S. Forrester, T. Nishida, S. Moghaddam, and J. L. Jones
JournalJournal of Alloys and Compounds
Volume646
Pagination655 - 661
Date PublishedJan-10-2015
ISSN09258388
URLhttp://linkinghub.elsevier.com/retrieve/pii/S0925838815302000
DOI10.1016/j.jallcom.2015.06.084
Short TitleJournal of Alloys and Compounds