Publications

Found 155 results
Author Title Type [ Year(Asc)]
Filters: Author is Nishida, Toshikazu  [Clear All Filters]
2008
Choi, Y., T. Numata, T. Nishida, R. Harris, and S. Thompson, "Impact of mechanical stress on gate tunneling currents of germanium and silicon p-type metal-oxide-semiconductor field-effect transistors and metal gate work function", J. Appl. Phys., vol. 103, pp. 064510-1–065410-5, MAR, 2008.
Martin, D., K. Kadirvel, T. Nishida, and M. Sheplak, "An Instrumentation Grade MEMS Condenser Microphone for Aeroacoustic Measurements", 46th AIAA Aerospace Sciences Meeting and Exhibit, AIAA-2008-257, January, 2008.
Li, Y., V. Chandrasekharan, B. Bertolucci, T. Nishida, L. Cattafesta, D. P. Arnold, and M. Sheplak, "A laterally-implanted piezoresistive skin-friction sensor", Solid-State Sensors, Actuators, and Microsystems Workshop, Hilton Head, SC, pp. 304-307, June, 2008.
Li, Y., V. Chandrasekharan, B. Bertolucci, T. Nishida, L. Cattafesta, and M. Sheplak, "A MEMS Shear Stress Sensor for Turbulence Measurements", 46th AIAA Aerospace Sciences Meeting and Exhibit, AIAA-2008-269, Reno, Nevada, January, 2008.
Liu, J., D. Martin, K. Kadirvel, T. Nishida, L. Cattafesta, M. Sheplak, and B. Mann, "Nonlinear Model and System Identification of a Capacitive Dual-Backplate MEMS Microphone", J. Sound Vib., vol. 309, no. 1-2, pp. 276-292, JAN, 2008.
Suthram, S., Y. Sun, P. Majhi, I. Ok, H. Kim, H. R. Harris, N. Goel, S. Parthasarathy, A. D. Koehler, A. Acosta, et al., "Strain Additivity in III-V Channels for CMOSFETs beyond 22nm Technology Node", 2008 VLSI Symposium on VLSI Technology, pp. 182-183, October, 2008.
Son, S. Y., Y. Choi, P. Kumar, H. W. Park, T. Nishida, R. K. Singh, and S. Thompson, "Strain induced changes in gate leakage current and dielectric constant of nitrided Hf-silicate metal oxide semiconductor capacitors", Appl. Phys. Lett., vol. 93, pp. 153505-1–153505-3, OCT, 2008.
Martin, D., K. Kadirvel, T. Nishida, and M. Sheplak, "A Surface Micromachined Capacitive Microphone for Aeroacoustic Applications", Solid-State Sensor, Actuator and Microsystems Workshop, Hilton Head, SC, June, 2008.
Sanchez, J. C., J. Principe, T. Nishida, R. Bashirullah, J. Harris, and J. Fortes, "Technology and Signal Processing for Brain-Machine Interfaces", IEEE Signal Processing Magazine, vol. 25, pp. 29-40, SEP, 2008.
Yang, X., S. Parthasarathy, Y. Sun, A. D. Koehler, T. Nishida, and S. Thompson, "Temperature dependence of enhanced hole mobility in uniaxial strained p-channel metal-oxide-semiconductor field-effect transistors and insight into the physical mechanisms", Appl. Phys. Lett., vol. 93, pp. 243503-1–243503-3, DEC, 2008.
Park, H. W., S. K. Dixit, Y. Choi, R. D. Schrimpf, E. Filangeri, T. Nishida, and S. Thompson, "Total Ionizing Dose Effects on Strained HfO2-based nMOSFETs", IEEE Transactions on Nuclear Science, vol. 55, pp. 2981-2985, DEC, 2008.
2007
Martin, D., "Design, fabrication, and characterization of a MEMS dual-backplate capacitive microphone", Deparment of Electrical and Computer Engineering, vol. Ph.D., Gainesville, University of Florida, pp. 250, 2007.
Kadirvel, K., D. Martin, J. Liu, R. M. Fox, M. Sheplak, L. Cattafesta, and T. Nishida, "Design, Modeling and Simulation of a Closed-Loop Controller for a Dual Backplate MEMS Capacitive Microphone", 6th IEEE Conference on Sensors, Atlanta, GA, pp. 87-90, October, 2007.
Homeijer, B., L. Cattafesta, T. Nishida, and M. Sheplak, "Design of a MEMS Piezoresistive Microphone for use in Aeroacoustic Measurements", 13th AIAA/CEAS Aeroacoustics Conference and Exhibit, Rome, Italy, May, 2007.
Horowitz, S., T. Nishida, L. Cattafesta, and M. Sheplak, "Development of a micromachined piezoelectric microphone for aeroacoustics applications", J. Acoust. Soc. Am., vol. 122, no. 6, pp. 3428-3436, DEC, 2007.
Wu, L., L. Fu, A. Jain, T. Nishida, M. Gu, and H. Xie, "An Endoscopic Nonlinear Optical Imaging Probe Based on 2-D Micromirror", LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting, Lake Buena Vista, FL, USA, IEEE, pp. 908 - 909, 10/2007.
Bashirullah, R., J. Harris, J. C. Sanchez, T. Nishida, and J. Principe, "Florida Wireless Implantable Recording Electrodes (FWIRE) for Brain Machine Interfaces", IEEE International Symposium on Circuits and Systems (ISCAS 2007), 2084 , June, 2007.
Yang, X., Y. Choi, T. Nishida, and S. Thompson, "Gate direct tunneling currents in uniaxial stressed MOSFETs", Proc. 2007 Intl. Workshop on Electron Dev and Semiconductor Technology, pp. 149-152, June, 2007.
Sun, G-Y., Y. Sun, T. Nishida, and S. Thompson, "Hole mobility in silicon inversion layers: Stress and surface orientation", Journal of Applied Physics, vol. 102, pp. 084501-1–084501-7, JAN, 2007.
Jun, J., B. Chou, J. Lin, A. Phipps, X. Shengwen, K. Ngo, D. Johnson, A. Kasyap V.S., T. Nishida, H. T. Wang, et al., "A hydrogen leakage detection system using self-powered wireless hydrogen sensor nodes", Solid-State Electronics, vol. 51, pp. 1018-1022, JUL, 2007.
Xu, S., K. Ngo, T. Nishida, G-B. Chung, and A. Sharma, "Low Frequency Pulsed Resonant Converter for Energy Harvesting", IEEE Trans. Power Electronics, vol. 22, pp. 63-68, JAN, 2007.
Feng, X., A. Jain, S. Pal, L. Xiao, T. Nishida, and H. Xie, "LVD micromirror for rapid reference scanning in optical coherence tomography", MEMS/MOEMS Components and Their Applications IV, vol. 6464, no. 1: SPIE, pp. 64640M, 02/2007.
Feng, X., A. Jain, S. Pal, T. Nishida, and H. Xie, "LVD Micromirror for Rapid Reference Scanning in Optical Coherence Tomography", Proceedings of the Photonics West, Paper 6464-22, San Jose, CA, January, 2007.
Choi, Y., J-S. Lim, T. Numata, T. Nishida, T. Nishida, and S. Thompson, "Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium", Journal of Applied Physics, vol. 102, pp. 104507-1–104507-5, DEC, 2007.
Choi, Y., J-S. Lim, T. Numata, T. Nishida, T. Nishida, and S. Thompson, "Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium", Journal of Applied Physics, vol. 102, pp. 104507-1–104507-5, DEC, 2007.