Gate direct tunneling currents in uniaxial stressed MOSFETs

TitleGate direct tunneling currents in uniaxial stressed MOSFETs
Publication TypeConference Paper
Year of Publication2007
AuthorsYang, X., Y. Choi, T. Nishida, and S. Thompson
Conference NameProc. 2007 Intl. Workshop on Electron Dev and Semiconductor Technology
Date PublishedJune