Title | Total Ionizing Dose Effects on Strained HfO2-based nMOSFETs |
Publication Type | Journal Article |
Year of Publication | 2008 |
Authors | Park, H. W., S. K. Dixit, Y. Choi, R. D. Schrimpf, E. Filangeri, T. Nishida, and S. Thompson |
Journal | IEEE Transactions on Nuclear Science |
Volume | 55 |
Pagination | 2981-2985 |
Date Published | DEC |
DOI | 10.1109/TNS.2008.2006837 |