| Title | Total Ionizing Dose Effects on Strained HfO2-based nMOSFETs |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | Park, H. W., S. K. Dixit, Y. Choi, R. D. Schrimpf, E. Filangeri, T. Nishida, and S. Thompson |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 55 |
| Pagination | 2981-2985 |
| Date Published | DEC |
| DOI | 10.1109/TNS.2008.2006837 |
