Publications

Pozzi, A., H.Y. Ling, C.A. Tonks, B.T. Wise, S. Guo, K.M. Thieman, and H. Xie, "Optical coherence tomography for diagnosing meniscal pathology in dogs: a pilot study", Veterinary Orthopedic Society Annual Meeting, Steamboat, CO, 2009.

Siauw, W. Long, J-P. Bonnet, J. Tensi, and L. Cattafesta, "Physics of Separated Flow over a NACA 0015 Airfoil and Detection of Flow Separation", 47th AIAA Aerospace Sciences Meeting, AIAA Paper 2009-144, January, 2009.

Ling, H.Y., S. Guo, K.M. Thieman, B.T. Wise, A. Pozzi, H. Xie, and M. Horodyski, "The potential of optical coherence tomography in meniscal tear characterization", Photonics West 2009, San Francisco, California, 2009.

Choi, Y., H. W. Park, T. Nishida, and S. Thompson, "Reliability of HfSiON gate dielectric silicon MOS devices under [110] mechanical stress: Time dependent dielectric breakdown", J. Appl. Phys., vol. 105, pp. 044503-1–044503-5, FEB, 2009.

Cattafesta, L., Y. Tian, and R. Mittal, The Aerodynamics of Heavy Vehicles II: Trucks, Buses, and Trains, Lecture Notes in Applied and Computational Mechanics, vol. 21: Springer, pp. 151-160, DEC, 2008.

Chu, M., T. Nishida, X. Lu, N. Mohta, and S. Thompson, "Comparison between high-field piezoresistive coefficients of Si metal-oxide-semiconductor field-effect transistors and bulk Si under uniaxial and biaxial stress", J. Appl. Phys., vol. 103, pp. 113704-1–113704-7, JUN, 2008.

Todd, S., and H. Xie, "An Electrothermomechanical Lumped Element Model of an Electrothermal Bimorph Actuator", Journal of Microelectromechanical Systems, vol. 17, issue 1, pp. 213 - 225, 02/2008.

Choi, Y., T. Nishida, and S. Thompson, "Impact of mechanical stress on direct and trap-assisted gate leakage currents in p-type silicon metal-oxide-semiconductor capacitors", Appl. Phys. Lett., vol. 92, pp. 173507-1–173507-3, APR, 2008.

Choi, Y., T. Numata, T. Nishida, R. Harris, and S. Thompson, "Impact of mechanical stress on gate tunneling currents of germanium and silicon p-type metal-oxide-semiconductor field-effect transistors and metal gate work function", J. Appl. Phys., vol. 103, pp. 064510-1–065410-5, MAR, 2008.

Sheplak, M., L. Cattafesta, and Y. Tian, IUTAM Symposium on Flow Control and MEMS, vol. 7, pp. 67-73, 2008.

Boniche, I., B. C. Morgan, P. Taylor, C. D. Meyer, and D. P. Arnold, "Process development and material characterization of polycrystalline Bi2Te3, PbTe, and PbSnSeTe thin films on silicon for millimeter-scale thermoelectric generators", J. Vacuum Sci. Tech. A, vol. 26, no. 4, pp. 739-744, JUL, 2008.

Suthram, S., Y. Sun, P. Majhi, I. Ok, H. Kim, H. R. Harris, N. Goel, S. Parthasarathy, A. D. Koehler, A. Acosta, et al., "Strain Additivity in III-V Channels for CMOSFETs beyond 22nm Technology Node", 2008 VLSI Symposium on VLSI Technology, pp. 182-183, October, 2008.

Suthram, S., Y. Sun, P. Majhi, I. Ok, H. Kim, H. R. Harris, N. Goel, S. Parthasarathy, A. D. Koehler, A. Acosta, et al., "Strain Additivity in III-V Channels for CMOSFETs beyond 22nm Technology Node", 2008 VLSI Symposium on VLSI Technology, pp. 182-183, October, 2008.

Suthram, S., Y. Sun, P. Majhi, I. Ok, H. Kim, H. R. Harris, N. Goel, S. Parthasarathy, A. D. Koehler, A. Acosta, et al., "Strain Additivity in III-V Channels for CMOSFETs beyond 22nm Technology Node", 2008 VLSI Symposium on VLSI Technology, pp. 182-183, October, 2008.

Son, S. Y., Y. Choi, P. Kumar, H. W. Park, T. Nishida, R. K. Singh, and S. Thompson, "Strain induced changes in gate leakage current and dielectric constant of nitrided Hf-silicate metal oxide semiconductor capacitors", Appl. Phys. Lett., vol. 93, pp. 153505-1–153505-3, OCT, 2008.

Yang, X., S. Parthasarathy, Y. Sun, A. D. Koehler, T. Nishida, and S. Thompson, "Temperature dependence of enhanced hole mobility in uniaxial strained p-channel metal-oxide-semiconductor field-effect transistors and insight into the physical mechanisms", Appl. Phys. Lett., vol. 93, pp. 243503-1–243503-3, DEC, 2008.

Park, H. W., S. K. Dixit, Y. Choi, R. D. Schrimpf, E. Filangeri, T. Nishida, and S. Thompson, "Total Ionizing Dose Effects on Strained HfO2-based nMOSFETs", IEEE Transactions on Nuclear Science, vol. 55, pp. 2981-2985, DEC, 2008.

Yang, X., Y. Choi, T. Nishida, and S. Thompson, "Gate direct tunneling currents in uniaxial stressed MOSFETs", Proc. 2007 Intl. Workshop on Electron Dev and Semiconductor Technology, pp. 149-152, June, 2007.

Sun, G-Y., Y. Sun, T. Nishida, and S. Thompson, "Hole mobility in silicon inversion layers: Stress and surface orientation", Journal of Applied Physics, vol. 102, pp. 084501-1–084501-7, JAN, 2007.

Jun, J., B. Chou, J. Lin, A. Phipps, X. Shengwen, K. Ngo, D. Johnson, A. Kasyap V.S., T. Nishida, H. T. Wang, et al., "A hydrogen leakage detection system using self-powered wireless hydrogen sensor nodes", Solid-State Electronics, vol. 51, pp. 1018-1022, JUL, 2007.

Feng, X., A. Jain, S. Pal, L. Xiao, T. Nishida, and H. Xie, "LVD micromirror for rapid reference scanning in optical coherence tomography", MEMS/MOEMS Components and Their Applications IV, vol. 6464, no. 1: SPIE, pp. 64640M, 02/2007.

Choi, Y., J-S. Lim, T. Numata, T. Nishida, T. Nishida, and S. Thompson, "Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium", Journal of Applied Physics, vol. 102, pp. 104507-1–104507-5, DEC, 2007.

Song, Q., Y. Tian, and L. Cattafesta, "MIMO Feedback Control of Flow Separation", 45th AIAA Aerospace Sciences Meeting and Exhibit, AIAA-2007-0109, Reno, NV, January, 2007.

Sun, Y., S. Thompson, and T. Nishida, "Physics of Strain Effects in Semiconductors and Metal-Oxide-Semiconductor Field-effect Transistors", Journal of Applied Physics, vol. 101, pp. 104503-107524, JAN, 2007.

Suthram, S., J. Ziegert, T. Nishida, and S. Thompson, "Piezoresistance Coefficients of (100) Silicon nMOSFETs Measured at Low and High ( 1.5GPa) Channel Stress", IEEE Electron. Dev. Lett., vol. 28, pp. 58-61, JAN, 2007.