| Title | Comparison between high-field piezoresistive coefficients of Si metal-oxide-semiconductor field-effect transistors and bulk Si under uniaxial and biaxial stress |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | Chu, M., T. Nishida, X. Lu, N. Mohta, and S. Thompson |
| Journal | J. Appl. Phys. |
| Volume | 103 |
| Pagination | 113704-1–113704-7 |
| Date Published | JUN |
| DOI | 10.1063/1.2936890 |
