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"Total-Ionizing-Dose Effects on Al/SiO 2 Bimorph Electrothermal Microscanners", IEEE Transactions on Nuclear Science, vol. 65, issue 8, pp. 2260 - 2267, Jan-08-2018.
, "Total-Ionizing-Dose Effects on Al/SiO 2 Bimorph Electrothermal Microscanners", IEEE Transactions on Nuclear Science, vol. 65, issue 8, pp. 2260 - 2267, Jan-08-2018.
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