Total-Ionizing-Dose Effects on Al/SiO <sub>2</sub> Bimorph Electrothermal Microscanners

TitleTotal-Ionizing-Dose Effects on Al/SiO 2 Bimorph Electrothermal Microscanners
Publication TypeJournal Article
Year of Publication2018
AuthorsLiao, W., E. Xia Zhang, M. L. Alles, A. L. Sternberg, C. N. Arutt, D. Wang, S. E. Zhao, P. Wang, M. W. McCurdy, H. Xie, D. M. Fleetwood, R. A. Reed, and R. D. Schrimpf
JournalIEEE Transactions on Nuclear Science
Volume65
Issue8
Pagination2260 - 2267
Date PublishedJan-08-2018
ISSN0018-9499
URLhttps://ieeexplore.ieee.org/document/8404120/
DOI10.1109/TNS.2018.2853139
Short TitleIEEE Trans. Nucl. Sci.