| Title | Total-Ionizing-Dose Effects on Al/SiO 2 Bimorph Electrothermal Microscanners |
| Publication Type | Journal Article |
| Year of Publication | 2018 |
| Authors | Liao, W., E. Xia Zhang, M. L. Alles, A. L. Sternberg, C. N. Arutt, D. Wang, S. E. Zhao, P. Wang, M. W. McCurdy, H. Xie, D. M. Fleetwood, R. A. Reed, and R. D. Schrimpf |
| Journal | IEEE Transactions on Nuclear Science |
| Volume | 65 |
| Issue | 8 |
| Pagination | 2260 - 2267 |
| Date Published | Jan-08-2018 |
| ISSN | 0018-9499 |
| URL | https://ieeexplore.ieee.org/document/8404120/http://xplorestaging.ieee.org/ielx7/23/8438572/08404120.pdf?arnumber=8404120 |
| DOI | 10.1109/TNS.2018.2853139 |
| Short Title | IEEE Trans. Nucl. Sci. |
