Publications

Found 4 results
Author Title Type [ Year(Desc)]
Filters: Author is Chih-Tang Sah  [Clear All Filters]
1987
Nishida, T., and C-T. Sah, "A physically based mobility model for MOSFET numerical simulation", IEEE Trans. Electron Devices, vol. 34, no. 2, pp. 310-320, FEB, 1987.
Lu, S., T. Nishida, and C-T. Sah, "Thermal emission and capture rates of holes at the gold donor level in silicon", Journal of Applied Physics, vol. 62, no. 12, pp. 4773-4780, DEC, 1987.
1988
Hsu, C-H., T. Nishida, and C-T. Sah, "Observation of threshold oxide electric field for trap generation in oxide films on silicon", Journal of Applied Physics, vol. 63, no. 12, pp. 5882-5884, DEC, 1988.
1995
Neugroschel, A., C-T. Sah, K. Han, M. Carroll, T. Nishida, J. Kavalieros, and Y. Lu, "Direct-current measurements of oxide and interface traps on oxidized silicon", IEEE Trans. Electron Dev., vol. 42, pp. 1657-1662, SEP, 1995.