| Title | Direct-current measurements of oxide and interface traps on oxidized silicon |
| Publication Type | Journal Article |
| Year of Publication | 1995 |
| Authors | Neugroschel, A., C-T. Sah, K. Han, M. Carroll, T. Nishida, J. Kavalieros, and Y. Lu |
| Journal | IEEE Trans. Electron Dev. |
| Volume | 42 |
| Pagination | 1657-1662 |
| Date Published | SEP |
| DOI | 10.1109/16.405281 |
