| Title | Observation of threshold oxide electric field for trap generation in oxide films on silicon |
| Publication Type | Journal Article |
| Year of Publication | 1988 |
| Authors | Hsu, C-H., T. Nishida, and C-T. Sah |
| Journal | Journal of Applied Physics |
| Volume | 63 |
| Pagination | 5882-5884 |
| Date Published | DEC |
| DOI | 10.1063/1.340281 |
