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Miniature Wireless Charging System for Cluttered Environments

There is an increasing demand for wireless power charging of mobile electronic devices, electric vehicles, biomedical implants and IoT sensor networks. Many of the already available wireless power transmission systems are based on inductive coupling and the size ranges in the cm’s scale, linked to the large surface area requirement. A competing technology is based on an RF approach, with small size chip but impractical power levels of pW to µW, and efficiency close to unity.

Daniel Alabi, Nicolas Garraud and John Varela won the Best Poster and the Best Demo Awards at the MIST 2017 Fall Meeting

Submitted by Alexandra Garraud on Fri, 12/15/2017 - 2:27pm

Congratulations to Daniel Alabi, Nicolas Garraud and John Varela for winning the Best Poster and the Best Demo Awards at the MIST 2017 Fall Meeting for their project "Chip-Scale MEMS Receivers for Low-Power Wireless Charging."

Advisors: Dr. Alexandra Garraud and Dr. David Arnold

IMG @ IEEE IEDM 2017

Submitted by Roozbeh Tabrizian on Wed, 11/29/2017 - 9:24am

UF and IMG will be represented at the upcoming IEEE International Electron Device Meeting (IEDM) in December 2017 in San Francisco.

High-Q Silicon Fin Bulk Acoustic Resonators for Signal Processing beyond the UHF (Oral)
M. Ramezani, M. Ghatge, and R. Tabrizian
University of Florida, USA

The IEEE International Electron Device Meeting (IEDM) is the world’s preeminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling. IEDM is the flagship conference for nanometer-scale CMOS transistor technology, advanced memory, displays, sensors, MEMS devices, novel quantum and nano-scale devices and phenomenology, optoelectronics, devices for power and energy harvesting, high-speed devices, as well as process technology and device modeling and simulation.

Dr. Xie named 2018 IEEE Fellow

Submitted by Haoran Wang on Wed, 11/22/2017 - 12:04pm

Professor Huikai Xie from the Interdisciplinary Microsystem Group was elevated as an IEEE Fellow 2018. IEEE Fellow is a distinction reserved for select IEEE members with an extraordinary record of accomplishments in any of the IEEE fields of interest. Dr. Xie was awarded for his distinguished contributions to micro-electromechanical optical scanning systems. IMG extends its warmest congratulations!

For more information, please visit IEEE Fellow News and the newly elevated fellow list.