Publications

Found 3 results
Author Title Type [ Year(Asc)]
Filters: Author is Toshikazu Nishida and First Letter Of Title is R  [Clear All Filters]
2009
Choi, Y., H. W. Park, T. Nishida, and S. Thompson, "Reliability of HfSiON gate dielectric silicon MOS devices under [110] mechanical stress: Time dependent dielectric breakdown", J. Appl. Phys., vol. 105, pp. 044503-1–044503-5, FEB, 2009.
2003
Wang, Z., J. Li, T. Nishida, and M. Sheplak, "Robust Capon Beamformers for Wideband Acoustic Imaging", 9th AIAA/CEAS Aeroacoustics Conference, AIAA Paper 2003-3198, Hilton Head, SC, May, 2003.
1999
Kurdila, A., B. Carroll, T. Nishida, and M. Sheplak, "Reduced Order Modeling for Low Reynolds Number Flow Control", Proceedings of SPIEs 6th Annual International Symposium on Smart Structures and Materials, Mathematics Modeling and Control Conference, vol. 3667, Newport Beach, CA, pp. 68-79, March, 1999.