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Jim L. Davidson
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2022
Sui, W.
,
X-Q. Zheng
,
J-T. Lin
,
J. Lee
,
J. L. Davidson
,
R. A. Reed
,
R. D. Schrimpf
,
B. W. Alphenaar
,
M. L. Alles
, and
P. X. - L. Feng
,
"
Effects of Ion-Induced Displacement Damage on GaN/AlN MEMS Resonators
"
,
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
, vol. 69, issue 3, January 14, 2022.