Skip to main content
Toggle navigation
Home
News
News
Calendar
People
Faculty
Members
Alumni
Research groups
Research
Projects
Publications
Sponsors
About IMG
About IMG
Facilities
Directions
Contact faculty
IMG Annual Report
IMG Social
IMG's 25th Anniversary
IMG User Login
Search
Publications
Found 1 results
Author
Title
Type
[
Year
]
Filters:
Author
is
Yi Liu
[Clear All Filters]
2004
Sadat, A.
,
Y. Liu
,
J. Yuan
, and
H. Xie
,
"
Soft breakdown effects on MOS switch and passive mixer
"
,
2004 IEEE International Reliability Physics Symposium.2004 IEEE International Reliability Physics Symposium. Proceedings
, Phoenix, AZ, USA, IEEE, pp. 653 - 654, 04/2004.