| Title | An electrothermal microlens scanner with low-voltage large-vertical-displacement actuation |
| Publication Type | Journal Article |
| Year of Publication | 2005 |
| Authors | Jain, A., and H. Xie |
| Journal | IEEE Photonics Technology Letters |
| Volume | 17 |
| Issue | 9 |
| Pagination | 1971 - 1973 |
| Date Published | 09/2005 |
| ISSN | 1041-1135 |
| Keywords | electrothermal actuation, large-verticaldisplacement (LVD) microactuator, microelectromechanical systems (MEMS), microlens scanner, optical imaging. |
| Abstract | This letter reports the design, fabrication, and operation of a microlens scanner that can perform large vertical scans at low actuation voltages. Photoresist (PR) reflow technique was used to form a 210-μm-diameter PR microlens on a lens holder which is integrated with a large-vertical-displacement (LVD) microactuator. The lens holder is fabricated using a maskless deep-reactive-ion-etch complementary-metal-oxide-semiconductor microelectromechanical systems process. A maximum static vertical displacement of 280 μm is achieved with a 700 by 320 μm LVD device at a low actuation voltage of 10 V. The microlens has a focal length of 188 μm, a numerical aperture of 0.35, and a resonant frequency of about 1 kHz. |
| URL | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1498920 |
| DOI | 10.1109/LPT.2005.853223 |
| Short Title | IEEE Photon. Technol. Lett. |