| Title | Process Dependence of 1/f Noise and Defects in Ion Implanted p-Type Piezoresistors |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Dieme, R., J. Zhang, N. G. Rudawski, K. Jones, G. Bosman, M. Sheplak, and T. Nishida |
| Journal | Journal of Applied Physics |
| Volume | 112 |
| Start Page | 033702 |
| DOI | 10.1063 |
