High-throughput focused-ion-beam lithography using doubly charged ions

TitleHigh-throughput focused-ion-beam lithography using doubly charged ions
Publication TypeConference Paper
Year of Publication2013
AuthorsGarraud, N., J. Fridmann, B. P. Gila, and D. P. Arnold
Conference NameWorkshop on Enabling Nanofabrication for Rapid Innovation
Date Published08/2013
Conference LocationNapa, CA