Low Loss Cu/Co Multilayer Metaconductor Based Band Pass Filter Using Through Fused Silica Via (TFV) Technology

TitleLow Loss Cu/Co Multilayer Metaconductor Based Band Pass Filter Using Through Fused Silica Via (TFV) Technology
Publication TypeConference Paper
Year of Publication2021
AuthorsBowrothu, R., H-in. Kim, Y. Kyu Yoon, S. Schmidt, and R. Santos
Conference Name2021 IEEE 71st Electronic Components and Technology Conference (ECTC)2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
PublisherIEEE
Conference LocationSan Diego, CA, USA
URLhttps://ieeexplore.ieee.org/document/9501869/http://xplorestaging.ieee.org/ielx7/9501397/9501403/09501869.pdf?arnumber=9501869
DOI10.1109/ECTC32696.2021.00192