| Title | Strain-induced Changes in the Gate Tunneling Currents in p-channel Metal-Oxide-Semiconductor Field-Effect Transistors |
| Publication Type | Journal Article |
| Year of Publication | 2006 |
| Authors | Yang, X., J. Lim, G-Y. Sun, K. Wu, T. Nishida, and S. Thompson |
| Journal | Applied Phys. Lett. |
| Volume | 88 |
| Pagination | 052108 |
| Date Published | JAN |
| URL | http://dx.doi.org/10.1063/1.2168671 |
| DOI | 10.1063/1.2168671 |
