Title | Oxide field and thickness dependence of trap generation in 9-30 nm dry and dry/wet/dry oxides |
Publication Type | Journal Article |
Year of Publication | 1991 |
Authors | Nishida, T., and S. Thompson |
Journal | Journal of Applied Physics |
Volume | 69 |
Pagination | 3986-3994 |
Date Published | DEC |
DOI | 10.1063/1.348914 |