Oxide field and thickness dependence of trap generation in 9-30 nm dry and dry/wet/dry oxides

TitleOxide field and thickness dependence of trap generation in 9-30 nm dry and dry/wet/dry oxides
Publication TypeJournal Article
Year of Publication1991
AuthorsNishida, T., and S. Thompson
JournalJournal of Applied Physics
Volume69
Pagination3986-3994
Date PublishedDEC
DOI10.1063/1.348914