| Title | Tunneling and thermal emission of electrons from a distribution of shallow traps in SiO2 |
| Publication Type | Journal Article |
| Year of Publication | 1991 |
| Authors | Thompson, S., and T. Nishida |
| Journal | Applied Physics Letters |
| Volume | 58 |
| Pagination | 1262-1264 |
| Date Published | DEC |
| DOI | 10.1063/1.104330 |
