| Title | A new measurement method for trap properties in insulators and semiconductors - Using electric field stimulated trap-to-band tunneling transitions in |
| Publication Type | Journal Article |
| Year of Publication | 1991 |
| Authors | Thompson, S., and T. Nishida |
| Journal | Journal of Applied Physics |
| Volume | 70 |
| Pagination | 6864-6876 |
| Date Published | DEC |
| DOI | 10.1063/1.349810 |
