| Title | BiMOS and SMOSC structures for MOS parameter measurement |
| Publication Type | Journal Article |
| Year of Publication | 1992 |
| Authors | Nishida, T. |
| Journal | Solid-State Electronics |
| Volume | 35 |
| Pagination | 357-369 |
| Date Published | MAR |
| DOI | 10.1016/0038-1101(92)90239-9 |
