Positive charge generation in SiO2 by electron-impact-emission of trapped electrons

TitlePositive charge generation in SiO2 by electron-impact-emission of trapped electrons
Publication TypeJournal Article
Year of Publication1992
AuthorsThompson, S., and T. Nishida
JournalJournal of Applied Physics
Volume72
Pagination4683-4695
Date PublishedNOV
DOI10.1063/1.352074