| Title | Positive charge generation in SiO2 by electron-impact-emission of trapped electrons |
| Publication Type | Journal Article |
| Year of Publication | 1992 |
| Authors | Thompson, S., and T. Nishida |
| Journal | Journal of Applied Physics |
| Volume | 72 |
| Pagination | 4683-4695 |
| Date Published | NOV |
| DOI | 10.1063/1.352074 |
