| Title | Measurement of Conduction Band Deformation Potential Constants Using Gate Direct Tunneling Current in n-MOSFETs Under Mechanical Stress |
| Publication Type | Journal Article |
| Year of Publication | 2006 |
| Authors | Lim, J., X. Yang, T. Nishida, and S. Thompson |
| Journal | Applied Physics Letters |
| Volume | 89 |
| Pagination | 073509 |
| Date Published | AUG |
| DOI | 10.1063/1.2245373 |
