Title | Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistors |
Publication Type | Journal Article |
Year of Publication | 2009 |
Authors | Lim, J-S., A. Acosta, S. Thompson, G. Bosman, E. Simoen, and T. Nishida |
Journal | J. Appl. Phys. |
Volume | 105 |
Pagination | 054504-1–054504-11 |
Date Published | MAR |
DOI | 10.1063/1.3080127 |