| Title | Strain effects on three-dimensional, two-dimensional, and one-dimensional silicon logic devices: Predicting the future of strained silicon |
| Publication Type | Journal Article |
| Year of Publication | 2010 |
| Authors | Baykan, M., S. Thompson, and T. Nishida |
| Journal | Journal of Applied Physics |
| Volume | 108 |
| Start Page | 093716 |
| Pagination | 093716-24 |
| Date Published | 11/2010 |
| ISSN | 0021-8979 |
| URL | http://link.aip.org/link/?JAP/108/093716 |
| DOI | 10.1063/1.3488635 |
