Publications

Koehler, A. D., A. Gupta, M. Chu, S. Parthasarathy, K. J. Linthicum, J. W. Johnson, T. Nishida, and S. Thompson, "Extraction of AlGaN/GaN HEMT Gauge Factor in the Presence of Traps", IEEE Electron Device Letters, vol. 31, pp. 3, 07/2010.

V.S., A. Kasyap, J. Lim, K. Ngo, A. Kurdila, T. Nishida, M. Sheplak, and L. Cattafesta, "Energy Reclamation from a Vibrating Piezoceramic Composite Beam", 9th International Congress on Sound and Vibration, Orlando, FL, July, 2002.

Wu, L., L. Fu, A. Jain, T. Nishida, M. Gu, and H. Xie, "An Endoscopic Nonlinear Optical Imaging Probe Based on 2-D Micromirror", LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting, Lake Buena Vista, FL, USA, IEEE, pp. 908 - 909, 10/2007.

Z. Fan, H., S. Augustine, C. Wang, P. Gu, Z. Xia, and T. Nishida, "Electrically Controlled Thermoelastic Valve Array for Multiplexed Immunoassay", 20th International Conference on Miniaturized Systems for Chemistry and Life Sciences (MicroTAS 2016), 2016.

Lim, J-S., A. Acosta, S. Thompson, G. Bosman, E. Simoen, and T. Nishida, "Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistors", J. Appl. Phys., vol. 105, pp. 054504-1–054504-11, MAR, 2009.

Smith, C. S., K. Sondhi, H. Z. Fan, T. Nishida, and D. P. Arnold, "Effect of Mechanical Cycling on the Magnetic Properties of Permalloy Films Electroplated on Stretchable Substrates", 2019 IEEE International Flexible Electronics Technology Conference (IFETC)2019 IEEE International Flexible Electronics Technology Conference (IFETC), Vancouver, BC, Canada, IEEE, 2019.

Walters, G., A. Shekhawat, J. Jones, S. Moghaddam, and T. Nishida, Effect of in situ hydrogen plasma on the ferroelectricity of hafnium zirconium oxide films, 2020.

Shekhawat, A., G. Walters, C. Chang Chung, Y. Liu, R. Garcia, J. Jones, T. Nishida, and S. Moghaddam, Effect of furnace annealing on the ferroelectricity of Hf0.5 Zr0.5O2 thin films, 2019.

Shekhawat, A., G. Walters, C. Chang Chung, Y. Liu, R. Garcia, J. Jones, T. Nishida, and S. Moghaddam, Effect of Forming Gas Furnace Annealing on the Ferroelectricity and Wake-Up Effect of Hf0.5Zr0.5O2 Thin Films, 2020.

Kang, B., S. Kim, J. Kim, F. Ren, K. Baik, S. J. Pearton, B. P. Gila, C. Abernathy, C. Pan, G. Chen, et al., "Effect of External Strain on the Conductivity of AlGaN/GaN High-Electron-Mobility Transistors", Applied Physics Letters, vol. 83, no. 23, pp. 4845-4847, DEC, 2003.