Publications
Found 214 results
Author Title Type [ Year] Filters: First Letter Of Last Name is N [Clear All Filters]
"A method for screening potential antioxidant activity", J. Biotechnology, vol. 51, pp. 149-155, DEC, 1996.
, "Direct-current measurements of oxide and interface traps on oxidized silicon", IEEE Trans. Electron Dev., vol. 42, pp. 1657-1662, SEP, 1995.
, "Direct-current measurements of oxide and interface traps on oxidized silicon", IEEE Trans. Electron Dev., vol. 42, pp. 1657-1662, SEP, 1995.
, "Sequential substrate and channel hot electron injection to separate oxide and interface traps in n-MOST", Solid-State Electronics, vol. 38, pp. 105-113, JAN, 1995.
, "Depth profile of thermal donor in boron-doped Czochralski-grown silicon", Journal of Applied Physics, vol. 75, pp. 7931-7934, JUN, 1994.
, "Hydrogenation of boron in silicon during low temperature gas and liquid phase processing", Journal of Applied Physics, vol. 76, pp. 332-335, JUL, 1994.
, "BiMOS and SMOSC structures for MOS parameter measurement", Solid-State Electronics, vol. 35, pp. 357-369, MAR, 1992.
, "Positive charge generation in SiO2 by electron-impact-emission of trapped electrons", Journal of Applied Physics, vol. 72, pp. 4683-4695, NOV, 1992.
, "A new measurement method for trap properties in insulators and semiconductors - Using electric field stimulated trap-to-band tunneling transitions in", Journal of Applied Physics, vol. 70, pp. 6864-6876, DEC, 1991.
, "Oxide field and thickness dependence of trap generation in 9-30 nm dry and dry/wet/dry oxides", Journal of Applied Physics, vol. 69, pp. 3986-3994, DEC, 1991.
, "Tunneling and thermal emission of electrons from a distribution of shallow traps in SiO2", Applied Physics Letters, vol. 58, pp. 1262-1264, DEC, 1991.
, "Observation of threshold oxide electric field for trap generation in oxide films on silicon", Journal of Applied Physics, vol. 63, no. 12, pp. 5882-5884, DEC, 1988.
, "A physically based mobility model for MOSFET numerical simulation", IEEE Trans. Electron Devices, vol. 34, no. 2, pp. 310-320, FEB, 1987.
, "Thermal emission and capture rates of holes at the gold donor level in silicon", Journal of Applied Physics, vol. 62, no. 12, pp. 4773-4780, DEC, 1987.
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