Publications

Found 155 results
Author Title Type [ Year(Desc)]
Filters: Author is Toshikazu Nishida  [Clear All Filters]
2008
Martin, D., K. Kadirvel, T. Nishida, and M. Sheplak, "An Instrumentation Grade MEMS Condenser Microphone for Aeroacoustic Measurements", 46th AIAA Aerospace Sciences Meeting and Exhibit, AIAA-2008-257, January, 2008.
Li, Y., V. Chandrasekharan, B. Bertolucci, T. Nishida, L. Cattafesta, D. P. Arnold, and M. Sheplak, "A laterally-implanted piezoresistive skin-friction sensor", Solid-State Sensors, Actuators, and Microsystems Workshop, Hilton Head, SC, pp. 304-307, June, 2008.
Li, Y., V. Chandrasekharan, B. Bertolucci, T. Nishida, L. Cattafesta, and M. Sheplak, "A MEMS Shear Stress Sensor for Turbulence Measurements", 46th AIAA Aerospace Sciences Meeting and Exhibit, AIAA-2008-269, Reno, Nevada, January, 2008.
Liu, J., D. Martin, K. Kadirvel, T. Nishida, L. Cattafesta, M. Sheplak, and B. Mann, "Nonlinear Model and System Identification of a Capacitive Dual-Backplate MEMS Microphone", J. Sound Vib., vol. 309, no. 1-2, pp. 276-292, JAN, 2008.
Suthram, S., Y. Sun, P. Majhi, I. Ok, H. Kim, H. R. Harris, N. Goel, S. Parthasarathy, A. D. Koehler, A. Acosta, et al., "Strain Additivity in III-V Channels for CMOSFETs beyond 22nm Technology Node", 2008 VLSI Symposium on VLSI Technology, pp. 182-183, October, 2008.
Son, S. Y., Y. Choi, P. Kumar, H. W. Park, T. Nishida, R. K. Singh, and S. Thompson, "Strain induced changes in gate leakage current and dielectric constant of nitrided Hf-silicate metal oxide semiconductor capacitors", Appl. Phys. Lett., vol. 93, pp. 153505-1–153505-3, OCT, 2008.
Martin, D., K. Kadirvel, T. Nishida, and M. Sheplak, "A Surface Micromachined Capacitive Microphone for Aeroacoustic Applications", Solid-State Sensor, Actuator and Microsystems Workshop, Hilton Head, SC, June, 2008.
Sanchez, J. C., J. Principe, T. Nishida, R. Bashirullah, J. Harris, and J. Fortes, "Technology and Signal Processing for Brain-Machine Interfaces", IEEE Signal Processing Magazine, vol. 25, pp. 29-40, SEP, 2008.
Yang, X., S. Parthasarathy, Y. Sun, A. D. Koehler, T. Nishida, and S. Thompson, "Temperature dependence of enhanced hole mobility in uniaxial strained p-channel metal-oxide-semiconductor field-effect transistors and insight into the physical mechanisms", Appl. Phys. Lett., vol. 93, pp. 243503-1–243503-3, DEC, 2008.
Park, H. W., S. K. Dixit, Y. Choi, R. D. Schrimpf, E. Filangeri, T. Nishida, and S. Thompson, "Total Ionizing Dose Effects on Strained HfO2-based nMOSFETs", IEEE Transactions on Nuclear Science, vol. 55, pp. 2981-2985, DEC, 2008.
2009
Phipps, A., F. Liu, L. Cattafesta, M. Sheplak, and T. Nishida, "Demonstration of a wireless, self-powered electroacoustic liner system", J. Acoust. Soc. Am, vol. 125, no. 2, pp. 873-881, FEB, 2009.
Patrick, E., V. Sankar, W. Rowe, J. C. Sanchez, and T. Nishida, "Design of an Implantable Intracortical Microelectrode System for Brain-Machine Interfaces", 4th International IEEE EMBS Conference on Neural Engineering, Antalya, Turkey, April, 2009.
Lim, J-S., A. Acosta, S. Thompson, G. Bosman, E. Simoen, and T. Nishida, "Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistors", J. Appl. Phys., vol. 105, pp. 054504-1–054504-11, MAR, 2009.
Phipps, A., and T. Nishida, "Formulation and Capture of the Second Voltage Peak Occuring From Piezoelectric Energy Harvesting Using a Pulsed Resonant Converter (PRC)", Tech. Dig. 9th Int. Workshop on Micro and Nanotechnology for Power Generation and Energy Conversion Apps. (PowerMEMS 2009), Washington, DC, December, 2009.
Park, H. W., D. J. Cummings, R. Arora, J. A. Pellish, R. Reed, R. D. Schrimpf, D. McMorrow, S. E. Armstrong, U. Roh, T. Nishida, et al., "Laser-Induced Current Transients in Strained-Si Diodes", IEEE Transactions Nuclear Science, vol. 56, pp. 7, 12/2009.
Pitchaimani, K., B. C. Sapp, A. Winter, A. Gispanski, T. Nishida, and H. Z. Fan, "Manufacturable plastic microfluidic valves using thermal actuation", Lab on a Chip, vol. 9, issue 21, pp. 3082, 2009.
Choi, Y., H. W. Park, T. Nishida, and S. Thompson, "Reliability of HfSiON gate dielectric silicon MOS devices under [110] mechanical stress: Time dependent dielectric breakdown", J. Appl. Phys., vol. 105, pp. 044503-1–044503-5, FEB, 2009.
2011
Gu, P., K. Liu, H. Chen, T. Nishida, and H. Z. Fan, "Chemical-Assisted Bonding of Thermoplastics/Elastomer for Fabricating Microfluidic Valves", Analytical Chemistry, vol. 83, issue 1, pp. 446 - 452, 01/2011.
Patrick, E., M. E. Orazem, J. C. Sanchez, and T. Nishida, "Corrosion of tungsten microelectrodes used in neural recording applications", J. Neuroscience Methods, vol. 198, pp. 14, 06/2011.
Prasad, A., V. Sankar, A. T. Dyer, E. Knott, Q-S. Xue, T. Nishida, J. R. Reynolds, G. Shaw, W. J. Streit, and J. C. Sanchez, "Coupling Biotic and Abiotic Metrics to Create a Testbed for Predicting Neural Electrode Performance", 33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC'11) August 30 - September 3, 2011, Boston, MA, 08/2011.