Publications

Found 155 results
Author Title [ Type(Desc)] Year
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Journal Article
Lomenzo, P. D., Q. Takmeel, C. M. Fancher, C. Zhou, N. G. Rudawski, S. Moghaddam, J. L. Jones, and T. Nishida, "Ferroelectric Si-Doped HfO2 Device Properties on Highly Doped Germanium", IEEE Electron Device Letters, vol. 36, issue 8, pp. 766 - 768, Jan-08-2015.
Liu, J., D. Martin, T. Nishida, L. Cattafesta, M. Sheplak, and B. Mann, "Harmonic Balance Nonlinear Identification of a capacitive dual-backplate MEMS microphone", J. Microelectromechanical Systems, vol. 17, no. 3, pp. 698-708, JUN, 2008.
Bhanvadia, A. A., R. T. Farley, Y. Noh, and T. Nishida, "High-resolution stereolithography using a static liquid constrained interface", Communications Materials, vol. 2, issue 1, 2021.
Sun, G-Y., Y. Sun, T. Nishida, and S. Thompson, "Hole mobility in silicon inversion layers: Stress and surface orientation", Journal of Applied Physics, vol. 102, pp. 084501-1–084501-7, JAN, 2007.
Jun, J., B. Chou, J. Lin, A. Phipps, X. Shengwen, K. Ngo, D. Johnson, A. Kasyap V.S., T. Nishida, H. T. Wang, et al., "A hydrogen leakage detection system using self-powered wireless hydrogen sensor nodes", Solid-State Electronics, vol. 51, pp. 1018-1022, JUL, 2007.
Filangeri, E., and T. Nishida, "Hydrogenation of boron in silicon during low temperature gas and liquid phase processing", Journal of Applied Physics, vol. 76, pp. 332-335, JUL, 1994.
Choi, Y., T. Nishida, and S. Thompson, "Impact of mechanical stress on direct and trap-assisted gate leakage currents in p-type silicon metal-oxide-semiconductor capacitors", Appl. Phys. Lett., vol. 92, pp. 173507-1–173507-3, APR, 2008.
Choi, Y., T. Numata, T. Nishida, R. Harris, and S. Thompson, "Impact of mechanical stress on gate tunneling currents of germanium and silicon p-type metal-oxide-semiconductor field-effect transistors and metal gate work function", J. Appl. Phys., vol. 103, pp. 064510-1–065410-5, MAR, 2008.
Park, H. W., D. J. Cummings, R. Arora, J. A. Pellish, R. Reed, R. D. Schrimpf, D. McMorrow, S. E. Armstrong, U. Roh, T. Nishida, et al., "Laser-Induced Current Transients in Strained-Si Diodes", IEEE Transactions Nuclear Science, vol. 56, pp. 7, 12/2009.
Xu, S., K. Ngo, T. Nishida, G-B. Chung, and A. Sharma, "Low Frequency Pulsed Resonant Converter for Energy Harvesting", IEEE Trans. Power Electronics, vol. 22, pp. 63-68, JAN, 2007.
Augustine, S., P. Gu, X. Zheng, T. Nishida, and H. Z. Fan, "Low-power electrically controlled thermoelastic microvalves integrated in thermoplastic microfluidic devices", Microfluidics and Nanofluidics, vol. 19, issue 6, pp. 1385 - 1394, 12/2015.
Gallas, Q., R. Holman, T. Nishida, B. Carroll, M. Sheplak, and L. Cattafesta, "Lumped Element Modeling of Piezoelectric-Driven Synthetic Jet Actuators", AIAA Journal, vol. 41, issue 2, no. 2, pp. 240-247, MAR, 2003.
Pitchaimani, K., B. C. Sapp, A. Winter, A. Gispanski, T. Nishida, and H. Z. Fan, "Manufacturable plastic microfluidic valves using thermal actuation", Lab on a Chip, vol. 9, issue 21, pp. 3082, 2009.
Lim, J., X. Yang, T. Nishida, and S. Thompson, "Measurement of Conduction Band Deformation Potential Constants Using Gate Direct Tunneling Current in n-MOSFETs Under Mechanical Stress", Applied Physics Letters, vol. 89, pp. 073509, AUG, 2006.
Choi, Y., J-S. Lim, T. Numata, T. Nishida, T. Nishida, and S. Thompson, "Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium", Journal of Applied Physics, vol. 102, pp. 104507-1–104507-5, DEC, 2007.
Choi, Y., J-S. Lim, T. Numata, T. Nishida, T. Nishida, and S. Thompson, "Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium", Journal of Applied Physics, vol. 102, pp. 104507-1–104507-5, DEC, 2007.
Horowitz, S., M. Sheplak, L. Cattafesta, and T. Nishida, "A MEMS Acoustic Energy Harvester", J. Micromech. Microeng., vol. 16, pp. S174-S181, SEP, 2006.
Nishida, T., R. Matsukawa, K. Masaki, Z. Dubinsky, and I. Karube, "A method for screening potential antioxidant activity", J. Biotechnology, vol. 51, pp. 149-155, DEC, 1996.
Martin, D., J. Liu, K. Kadirvel, R. M. Fox, M. Sheplak, and T. Nishida, "A Micromachined Dual-Backplate Capacitive Microphone for Aeroacoustic Measurements", J. Microelectromechanical Systems, vol. 16, no. 6, pp. 1289-1302, DEC, 2007.
Lomenzo, P. D., Q. Takmeel, C. Zhou, C-C. Chung, S. Moghaddam, J. L. Jones, and T. Nishida, "Mixed Al and Si doping in ferroelectric HfO 2 thin films", Applied Physics Letters, vol. 107, issue 24, pp. 242903, Feb-12-2016, 2015.
Liu, F., S. Horowitz, T. Nishida, L. Cattafesta, and M. Sheplak, "A multiple degree of freedom electromechanical Helmholtz resonator", J. Acoust. Soc. Am., vol. 122, no. 1, pp. 291-301, JUL, 2007.
Thompson, S., and T. Nishida, "A new measurement method for trap properties in insulators and semiconductors - Using electric field stimulated trap-to-band tunneling transitions in", Journal of Applied Physics, vol. 70, pp. 6864-6876, DEC, 1991.
Liu, J., D. Martin, K. Kadirvel, T. Nishida, L. Cattafesta, M. Sheplak, and B. Mann, "Nonlinear Model and System Identification of a Capacitive Dual-Backplate MEMS Microphone", J. Sound Vib., vol. 309, no. 1-2, pp. 276-292, JAN, 2008.
Hsu, C-H., T. Nishida, and C-T. Sah, "Observation of threshold oxide electric field for trap generation in oxide films on silicon", Journal of Applied Physics, vol. 63, no. 12, pp. 5882-5884, DEC, 1988.
Nishida, T., and S. Thompson, "Oxide field and thickness dependence of trap generation in 9-30 nm dry and dry/wet/dry oxides", Journal of Applied Physics, vol. 69, pp. 3986-3994, DEC, 1991.