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Michael Carroll
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1995
Neugroschel, A.
,
C-T. Sah
,
K. Han
,
M. Carroll
,
T. Nishida
,
J. Kavalieros
, and
Y. Lu
,
"
Direct-current measurements of oxide and interface traps on oxidized silicon
"
,
IEEE Trans. Electron Dev.
, vol. 42, pp. 1657-1662, SEP, 1995.