Publications

Found 155 results
Author Title [ Type(Desc)] Year
Filters: Author is Nishida, Toshikazu  [Clear All Filters]
Journal Article
Liu, F., A. Phipps, S. Horowitz, K. Ngo, L. Cattafesta, T. Nishida, and M. Sheplak, "Acoustic energy harvesting using an electromechanical Helmholtz resonator", J. Acoust. Soc. Am., vol. 123, no. 4, APR, 2008.
Lomenzo, P. D., Q. Takmeel, S. Moghaddam, and T. Nishida, "Annealing behavior of ferroelectric Si-doped HfO2 thin films", Thin Solid Films, vol. 615, pp. 139 - 144, Jan-09-2016.
Nishida, T., "BiMOS and SMOSC structures for MOS parameter measurement", Solid-State Electronics, vol. 35, pp. 357-369, MAR, 1992.
Sheplak, M., A. Cain, T. Nishida, and L. Cattafesta, "Characterization of a Micromachined Thermal Shear Stress Sensor", AIAA Journal, vol. 40, no. 6, pp. 1099-1104, APR, 2002.
Horowitz, S., T. Nishida, L. Cattafesta, and M. Sheplak, "Characterization of Compliant-Backplate Helmholtz Resonators for an Electromechanical Acoustic Liner", International Journal of Aeroacoustics, vol. 1, no. 2, pp. 183-205, APR, 2002.
Gu, P., K. Liu, H. Chen, T. Nishida, and H. Z. Fan, "Chemical-Assisted Bonding of Thermoplastics/Elastomer for Fabricating Microfluidic Valves", Analytical Chemistry, vol. 83, issue 1, pp. 446 - 452, 01/2011.
Chu, M., T. Nishida, X. Lu, N. Mohta, and S. Thompson, "Comparison between high-field piezoresistive coefficients of Si metal-oxide-semiconductor field-effect transistors and bulk Si under uniaxial and biaxial stress", J. Appl. Phys., vol. 103, pp. 113704-1–113704-7, JUN, 2008.
Prasad, A., Q-S. Xue, V. Sankar, T. Nishida, G. Shaw, W. J. Streit, and J. C. Sanchez, "Comprehensive characterization and failure modes of tungsten microwire arrays in chronic neural implants", Journal of Neural Engineering, vol. 9, issue 5, no. 5, pp. 056015, 09/2012.
Wang, Z., J. Li, P. Stoica, M. Sheplak, and T. Nishida, "Constant-Beamwidth and Constant-Powerwidth Wideband Robust Capon Beamformers for Acoustic Imaging", J. Acoust. Soc. Am., vol. 116, no. 3, pp. 1621-1631, SEP, 2004.
Patrick, E., M. E. Orazem, J. C. Sanchez, and T. Nishida, "Corrosion of tungsten microelectrodes used in neural recording applications", J. Neuroscience Methods, vol. 198, pp. 14, 06/2011.
Phipps, A., F. Liu, L. Cattafesta, M. Sheplak, and T. Nishida, "Demonstration of a wireless, self-powered electroacoustic liner system", J. Acoust. Soc. Am, vol. 125, no. 2, pp. 873-881, FEB, 2009.
Filangeri, E., and T. Nishida, "Depth profile of thermal donor in boron-doped Czochralski-grown silicon", Journal of Applied Physics, vol. 75, pp. 7931-7934, JUN, 1994.
Horowitz, S., T. Nishida, L. Cattafesta, and M. Sheplak, "Development of a micromachined piezoelectric microphone for aeroacoustics applications", J. Acoust. Soc. Am., vol. 122, no. 6, pp. 3428-3436, DEC, 2007.
Neugroschel, A., C-T. Sah, K. Han, M. Carroll, T. Nishida, J. Kavalieros, and Y. Lu, "Direct-current measurements of oxide and interface traps on oxidized silicon", IEEE Trans. Electron Dev., vol. 42, pp. 1657-1662, SEP, 1995.
Arnold, D. P., T. Nishida, L. Cattafesta, and M. Sheplak, "A directional acoustic array using silicon micromachined piezoresistive microphones", J. Acous. Soc. Amer., vol. 113, no. 1, pp. 289-298, JAN, 2003.
Lomenzo, P. D., C-C. Chung, C. Zhou, J. L. Jones, and T. Nishida, "Doped Hf0.5Zr 0.5O 2 for high efficiency integrated supercapacitors", Applied Physics Letters, vol. 110, issue 23, pp. 232904, jun-09-2017.
Chandrasekaran, V., A. Cain, T. Nishida, L. Cattafesta, and M. Sheplak, "Dynamic calibration technique for thermal shear-stress sensors", Experiments in Fluids, vol. 38, pp. 56-65, JUL, 2005.
Kang, B., S. Kim, J. Kim, F. Ren, K. Baik, S. J. Pearton, B. P. Gila, C. Abernathy, C. Pan, G. Chen, et al., "Effect of External Strain on the Conductivity of AlGaN/GaN High-Electron-Mobility Transistors", Applied Physics Letters, vol. 83, no. 23, pp. 4845-4847, DEC, 2003.
Lim, J-S., A. Acosta, S. Thompson, G. Bosman, E. Simoen, and T. Nishida, "Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistors", J. Appl. Phys., vol. 105, pp. 054504-1–054504-11, MAR, 2009.
Koehler, A. D., A. Gupta, M. Chu, S. Parthasarathy, K. J. Linthicum, J. W. Johnson, T. Nishida, and S. Thompson, "Extraction of AlGaN/GaN HEMT Gauge Factor in the Presence of Traps", IEEE Electron Device Letters, vol. 31, pp. 3, 07/2010.