Publications

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Author Title [ Type(Desc)] Year
Filters: Author is Arnost Neugroschel  [Clear All Filters]
Journal Article
Neugroschel, A., C-T. Sah, K. Han, M. Carroll, T. Nishida, J. Kavalieros, and Y. Lu, "Direct-current measurements of oxide and interface traps on oxidized silicon", IEEE Trans. Electron Dev., vol. 42, pp. 1657-1662, SEP, 1995.