Found 155 results
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Phipps, A., F. Liu, L. Cattafesta, M. Sheplak, and T. Nishida, "Demonstration of a wireless, self-powered electroacoustic liner system", J. Acoust. Soc. Am, vol. 125, no. 2, pp. 873-881, FEB, 2009.
Patrick, E., V. Sankar, W. Rowe, J. C. Sanchez, and T. Nishida, "Design of an Implantable Intracortical Microelectrode System for Brain-Machine Interfaces", 4th International IEEE EMBS Conference on Neural Engineering, Antalya, Turkey, April, 2009.
Lim, J-S., A. Acosta, S. Thompson, G. Bosman, E. Simoen, and T. Nishida, "Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistors", J. Appl. Phys., vol. 105, pp. 054504-1–054504-11, MAR, 2009.
Phipps, A., and T. Nishida, "Formulation and Capture of the Second Voltage Peak Occuring From Piezoelectric Energy Harvesting Using a Pulsed Resonant Converter (PRC)", Tech. Dig. 9th Int. Workshop on Micro and Nanotechnology for Power Generation and Energy Conversion Apps. (PowerMEMS 2009), Washington, DC, December, 2009.
Park, H. W., D. J. Cummings, R. Arora, J. A. Pellish, R. Reed, R. D. Schrimpf, D. McMorrow, S. E. Armstrong, U. Roh, T. Nishida, et al., "Laser-Induced Current Transients in Strained-Si Diodes", IEEE Transactions Nuclear Science, vol. 56, pp. 7, 12/2009.
Pitchaimani, K., B. C. Sapp, A. Winter, A. Gispanski, T. Nishida, and H. Z. Fan, "Manufacturable plastic microfluidic valves using thermal actuation", Lab on a Chip, vol. 9, issue 21, pp. 3082, 2009.
Choi, Y., H. W. Park, T. Nishida, and S. Thompson, "Reliability of HfSiON gate dielectric silicon MOS devices under [110] mechanical stress: Time dependent dielectric breakdown", J. Appl. Phys., vol. 105, pp. 044503-1–044503-5, FEB, 2009.