Publications

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Author Title Type [ Year(Desc)]
Filters: Author is Yi Liu  [Clear All Filters]
2004
Sadat, A., Y. Liu, J. Yuan, and H. Xie, "Soft breakdown effects on MOS switch and passive mixer", 2004 IEEE International Reliability Physics Symposium.2004 IEEE International Reliability Physics Symposium. Proceedings, Phoenix, AZ, USA, IEEE, pp. 653 - 654, 04/2004.