Publications

Thompson, S., and T. Nishida, "Positive charge generation in SiO2 by electron-impact-emission of trapped electrons", Journal of Applied Physics, vol. 72, pp. 4683-4695, NOV, 1992.

Papila, M., R. T. Haftka, T. Nishida, and M. Sheplak, "Piezoresistive Microphone Design Pareto Optimization: Tradeoff between Sensitivity and Noise Floor", J. Microelectromechanical Systems, vol. 15, no. 6, pp. 1632-1643, DEC, 2006.

Suthram, S., J. Ziegert, T. Nishida, and S. Thompson, "Piezoresistance Coefficients of (100) Silicon nMOSFETs Measured at Low and High ( 1.5GPa) Channel Stress", IEEE Electron. Dev. Lett., vol. 28, pp. 58-61, JAN, 2007.

Sun, Y., S. Thompson, and T. Nishida, "Physics of Strain Effects in Semiconductors and Metal-Oxide-Semiconductor Field-effect Transistors", Journal of Applied Physics, vol. 101, pp. 104503-107524, JAN, 2007.

Nishida, T., and C-T. Sah, "A physically based mobility model for MOSFET numerical simulation", IEEE Trans. Electron Devices, vol. 34, no. 2, pp. 310-320, FEB, 1987.

Nishida, T., and S. Thompson, "Oxide field and thickness dependence of trap generation in 9-30 nm dry and dry/wet/dry oxides", Journal of Applied Physics, vol. 69, pp. 3986-3994, DEC, 1991.

Hsu, C-H., T. Nishida, and C-T. Sah, "Observation of threshold oxide electric field for trap generation in oxide films on silicon", Journal of Applied Physics, vol. 63, no. 12, pp. 5882-5884, DEC, 1988.

Liu, J., D. Martin, K. Kadirvel, T. Nishida, L. Cattafesta, M. Sheplak, and B. Mann, "Nonlinear Model and System Identification of a Capacitive Dual-Backplate MEMS Microphone", J. Sound Vib., vol. 309, no. 1-2, pp. 276-292, JAN, 2008.

Thompson, S., and T. Nishida, "A new measurement method for trap properties in insulators and semiconductors - Using electric field stimulated trap-to-band tunneling transitions in", Journal of Applied Physics, vol. 70, pp. 6864-6876, DEC, 1991.

Liu, F., S. Horowitz, T. Nishida, L. Cattafesta, and M. Sheplak, "A multiple degree of freedom electromechanical Helmholtz resonator", J. Acoust. Soc. Am., vol. 122, no. 1, pp. 291-301, JUL, 2007.

Lomenzo, P. D., Q. Takmeel, C. Zhou, C-C. Chung, S. Moghaddam, J. L. Jones, and T. Nishida, "Mixed Al and Si doping in ferroelectric HfO 2 thin films", Applied Physics Letters, vol. 107, issue 24, pp. 242903, Feb-12-2016, 2015.

Martin, D., J. Liu, K. Kadirvel, R. M. Fox, M. Sheplak, and T. Nishida, "A Micromachined Dual-Backplate Capacitive Microphone for Aeroacoustic Measurements", J. Microelectromechanical Systems, vol. 16, no. 6, pp. 1289-1302, DEC, 2007.

Nishida, T., R. Matsukawa, K. Masaki, Z. Dubinsky, and I. Karube, "A method for screening potential antioxidant activity", J. Biotechnology, vol. 51, pp. 149-155, DEC, 1996.

Horowitz, S., M. Sheplak, L. Cattafesta, and T. Nishida, "A MEMS Acoustic Energy Harvester", J. Micromech. Microeng., vol. 16, pp. S174-S181, SEP, 2006.

Choi, Y., J-S. Lim, T. Numata, T. Nishida, T. Nishida, and S. Thompson, "Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium", Journal of Applied Physics, vol. 102, pp. 104507-1–104507-5, DEC, 2007.

Choi, Y., J-S. Lim, T. Numata, T. Nishida, T. Nishida, and S. Thompson, "Mechanical stress altered electron gate tunneling current and extraction of conduction band deformation potentials for germanium", Journal of Applied Physics, vol. 102, pp. 104507-1–104507-5, DEC, 2007.

Lim, J., X. Yang, T. Nishida, and S. Thompson, "Measurement of Conduction Band Deformation Potential Constants Using Gate Direct Tunneling Current in n-MOSFETs Under Mechanical Stress", Applied Physics Letters, vol. 89, pp. 073509, AUG, 2006.

Pitchaimani, K., B. C. Sapp, A. Winter, A. Gispanski, T. Nishida, and H. Z. Fan, "Manufacturable plastic microfluidic valves using thermal actuation", Lab on a Chip, vol. 9, issue 21, pp. 3082, 2009.

Gallas, Q., R. Holman, T. Nishida, B. Carroll, M. Sheplak, and L. Cattafesta, "Lumped Element Modeling of Piezoelectric-Driven Synthetic Jet Actuators", AIAA Journal, vol. 41, issue 2, no. 2, pp. 240-247, MAR, 2003.

Augustine, S., P. Gu, X. Zheng, T. Nishida, and H. Z. Fan, "Low-power electrically controlled thermoelastic microvalves integrated in thermoplastic microfluidic devices", Microfluidics and Nanofluidics, vol. 19, issue 6, pp. 1385 - 1394, 12/2015.

Xu, S., K. Ngo, T. Nishida, G-B. Chung, and A. Sharma, "Low Frequency Pulsed Resonant Converter for Energy Harvesting", IEEE Trans. Power Electronics, vol. 22, pp. 63-68, JAN, 2007.

Park, H. W., D. J. Cummings, R. Arora, J. A. Pellish, R. Reed, R. D. Schrimpf, D. McMorrow, S. E. Armstrong, U. Roh, T. Nishida, et al., "Laser-Induced Current Transients in Strained-Si Diodes", IEEE Transactions Nuclear Science, vol. 56, pp. 7, 12/2009.

Choi, Y., T. Numata, T. Nishida, R. Harris, and S. Thompson, "Impact of mechanical stress on gate tunneling currents of germanium and silicon p-type metal-oxide-semiconductor field-effect transistors and metal gate work function", J. Appl. Phys., vol. 103, pp. 064510-1–065410-5, MAR, 2008.

Choi, Y., T. Nishida, and S. Thompson, "Impact of mechanical stress on direct and trap-assisted gate leakage currents in p-type silicon metal-oxide-semiconductor capacitors", Appl. Phys. Lett., vol. 92, pp. 173507-1–173507-3, APR, 2008.

Filangeri, E., and T. Nishida, "Hydrogenation of boron in silicon during low temperature gas and liquid phase processing", Journal of Applied Physics, vol. 76, pp. 332-335, JUL, 1994.