Publications

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Journal Article
Liao, W., E. Xia Zhang, M. L. Alles, A. L. Sternberg, C. N. Arutt, D. Wang, S. E. Zhao, P. Wang, M. W. McCurdy, H. Xie, et al., "Total-Ionizing-Dose Effects on Al/SiO 2 Bimorph Electrothermal Microscanners", IEEE Transactions on Nuclear Science, vol. 65, issue 8, pp. 2260 - 2267, Jan-08-2018.
Liao, W., E. Xia Zhang, M. L. Alles, A. L. Sternberg, C. N. Arutt, D. Wang, S. E. Zhao, P. Wang, M. W. McCurdy, H. Xie, et al., "Total-Ionizing-Dose Effects on Al/SiO 2 Bimorph Electrothermal Microscanners", IEEE Transactions on Nuclear Science, vol. 65, issue 8, pp. 2260 - 2267, Jan-08-2018.