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Liao, W., E. Xia Zhang, M. L. Alles, A. L. Sternberg, C. N. Arutt, D. Wang, S. E. Zhao, P. Wang, M. W. McCurdy, H. Xie, et al., "Total-Ionizing-Dose Effects on Al/SiO 2 Bimorph Electrothermal Microscanners", IEEE Transactions on Nuclear Science, vol. 65, issue 8, pp. 2260 - 2267, Jan-08-2018.