Publications
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Author Title [ Type] Year Filters: First Letter Of Title is S and Author is S. Y. Son [Clear All Filters]
"Strain induced changes in gate leakage current and dielectric constant of nitrided Hf-silicate metal oxide semiconductor capacitors", Appl. Phys. Lett., vol. 93, pp. 153505-1–153505-3, OCT, 2008.
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