Publications

Found 1 results
Author Title Type [ Year(Desc)]
Filters: First Letter Of Title is S and Author is Jiann Yuan  [Clear All Filters]
2004
Sadat, A., Y. Liu, J. Yuan, and H. Xie, "Soft breakdown effects on MOS switch and passive mixer", 2004 IEEE International Reliability Physics Symposium.2004 IEEE International Reliability Physics Symposium. Proceedings, Phoenix, AZ, USA, IEEE, pp. 653 - 654, 04/2004.