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Walters, G., P. Chojecki, A. Garraud, T. Nishida, S. Summerfelt, J. A. Rodriguez, and A. G. Acosta, "High-temperature and high-field cycling reliability of PZT films embedded within 130 nm CMOS", 2018 IEEE International Reliability Physics Symposium (IRPS)2018 IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, IEEE, 2018.