Publications

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Sui, W., X-Q. Zheng, J-T. Lin, J. Lee, J. L. Davidson, R. A. Reed, R. D. Schrimpf, B. W. Alphenaar, M. L. Alles, and P. X. - L. Feng, "Effects of Ion-Induced Displacement Damage on GaN/AlN MEMS Resonators", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 69, issue 3, January 14, 2022.