IMG Seminar: Special measurement techniques

Submitted by IMG System Admin on Thu, 06/10/2010 - 3:43pm
Event date: 
Fri, 06/11/2010 - 3:00pm to 4:00pm

Device and circuit characterization is one of the routine tasks that most IMG students will face. Some of the characterization procedures become very challenging because of equipment limitations. For example, the parameter being measured is out of the range of available equipments, or the equipment does not have the functionality to create conditions required by the measurement.

In this talk, three basic techniques are discussed to help solve some of the common problems. They are:

IMG on the Road to Hilton Head 2010

Submitted by IMG System Admin on Fri, 06/04/2010 - 10:07pm

This weekend, a large IMG contingent will set off for Hilton Head 2010, A Solid-State Sensors, Actuators, and Microsystems Workshop.  Held every two years in Hilton Head, SC, the workshop is the premiere meeting of microsystems companies and researchers in the Americas.  Professors Mark Sheplak and David Arnold are traveling to the conference, together with a number of students and post-docs.  Among those presenting posters are:

IMG Capacitive Shear Stress Sensor Featured in Popular Mechanics

Submitted by IMG System Admin on Fri, 06/04/2010 - 9:46pm

The capacitive shear stress sensor recently developed by Vijay Chandrasekharan here at IMG, which can measure a wider range of shear stress than any sensor before it, was recently featured in a South African edition of Popular Mechanics magazine.  Congratulations again to Vijay, now an IMG post-doctoral associate, whose work continues to receive international attention!

IMG Seminar: Object Oriented Programming in MATLAB (And How it Will Make Your Lumped Element Models Better)

Submitted by IMG System Admin on Tue, 05/25/2010 - 9:33am
Event date: 
Fri, 05/28/2010 - 3:00pm to 4:00pm

Within IMG, MATLAB codes are used extensively to predict device performance, usually via lumped element models (LEMs). As these models increase in complexity, it becomes harder to keep track of the many workspace variables, function input/output syntax, data formats, etc. It can also be extremely difficult to save simulation results or post-process in organized ways.