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DTSTART:20101107T020000
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DTSTART:20100314T020000
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UID:calendar.249.field_event_date.0@www.img.ufl.edu
DTSTAMP:20261017T020702Z
CREATED:20100610T194335Z
DESCRIPTION:Device and circuit characterization is one of the routine tasks
  that most IMG students will face. Some of the characterization procedures
  become very challenging because of equipment limitations. For example\, t
 he parameter being measured is out of the range of available equipments\, 
 or the equipment does not have the functionality to create conditions requ
 ired by the measurement.\n\n\n\n	In this talk\, three basic techniques are 
 discussed to help solve some of the common problems. They are:\n\n		Real-tim
 e measurement of small current (~20 uA) using a current prob.\n\n		Low frequ
 ency impedance measurement (< 40Hz) using a signal analyzer and current pr
 obe.\n\n		Closed loop acceleration control of the shaker\, accelerometer\, a
 nd signal analyzer.\n\n\n\n	The talk\, given by Shuo Cheng\, starts with a 
 30 minute technical overview in Larsen 234 followed by a 30 minute demo in
  Benton 214.\n\n\nEvent date: \n\nFriday\, June 11\, 2010 - 3:00pm to 4:00
 pm\n\nEvent location: \n\nLarsen 234
DTSTART;TZID=America/New_York:20100611T150000
DTEND;TZID=America/New_York:20100611T160000
LAST-MODIFIED:20100618T043641Z
LOCATION:Larsen 234
SUMMARY:IMG Seminar: Special measurement techniques
URL;TYPE=URI:https://www.img.ufl.edu/events/249/img-seminar-special-measure
 ment-techniques
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